Universal Profilometer

Multiple techniques
Nanometer resolution.
Fully automatic measurement and analysis
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Home > 3D Optical Microscopes > 3D Universal Profilometer

3D Optical Microscope Overview

Key Features

  • Combines 4 techniques in one head
  • Automatic reports
  • Measure any kind of surface

The UP-24 combines 4 imaging modes in one head. One click switches between the different imaging modes automatically.

White Light Interferometer + Spinning disk confocal + Dark Field Microscope + Bright field 3D Microscope

Precise, quantitative, and ISO-compliant with nanometer resolution. Additionally, the 3D Optical Profiler provides non-contact surface measurements from nano to micron. Capture up to 5 million data points in few seconds. The combination technology provides analysis of any surface with ease.

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    Four Modes In One Profilometer

    In-depth analysis with confocal or white light interferometry adapts the image to the needs of each sample.

    Dark Field Mode

    Allows detection of cracks at the surface with high contrast

    White Light Interferometer Mode

    High resolution images of flat surfaces

    Lambda universal profilometer rtec-instruments
    Confocal Microscopy Mode

    Measures dark, rough, and transparent surfaces

    Bright Field Mode

    2D profiles with high resolution and real colors

    Features

    Capture The Profile From Any Material

    Many options to choose from. Customize test depending on your application.

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    Specifications
    • Standard motorized stage 150x150mm (Optional 210 x 310mm)
    • Standard turret, motorized turret optional
    • Vertical range up to 100mm
    • Tip tilt stage 6 degree
    • Auto Stitching
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    Models
    • Sigma head – White Light Interferometer Only
    • Lambda head – White Light Interferometer + Confocal + Dark Field + Bright Field
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    Applications
    • Roughness
    • Volume Wear
    • Step Height
    • Film Thickness
    • Topography

    3D Images For Every Situation

    Combination of multiple optical techniques on same platform allows measurement of almost any kind of sample with nm resolution. Combined with powerful analysis software that is compliant with several standards.

    Diamond surface  data using rtec 3d optical microscope
    Diamond
    sand paper image on rtec universal profiler
    Abrasive Pad
    Polymer coating data using rtec 3d optical microscope
    Polymer Coating
    Abrasive surface profilometer image using Rtec profilometer
    Rough Coated Surface
    wafer topography using optical 3d microscope
    Semiconductor Wafer
    Ink surface  data using rtec 3d optical microscope
    Ink
    wafer scan using optical 3d microscope
    Standard Sample
    Ball scar image using rtec 3D microscope
    Ball Scar
    via 3d data using optical 3d microscope
    Via On A Chip
    wafer using optical 3d microscope
    PCB
    pillars scan using optical 3d microscope
    Deep Via on Mems
    Penny stitched data using rtec 3d optical microscope
    Stitched Coin
    wear scar image using optical 3d microscope
    Wear Mark
    Confocal image of filter paper
    Bio Membrane
    Micro fluidic data using Rtec 3D optical microscope
    Micro Fluidic Channel
    semiconductor wafer data using 3D optical microscope
    Semicon Wafer
    Wear mark with inline profilometer on rtec instruments tribometer
    Failure Mark on Aluminum
    Scratch failure test image
    Scratch Mark
    scratch adhesion test data showing coating failure
    Coating Failure Mark
    DLC coated ball data using Rtec 3D optical microscope
    DLC Coated Ball

    Solution To

     A wide range of industries extensively use the Universal Profilometer:

    • Aerospace
    • Automotive
    • Bio Materials
    • Coatings
    • Metals
    • Optics and Glasses
    • Polymer
    • Semicon
    • Pharmaceutical
    • Displays

    Want to learn more?

    Get in touch, and request a demo.

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