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MEASURE SCRATCH WEAR DEPTH, WIDTH AND VOLUME

Measurement of wear, scar, scratch, depth, defect, step height

Rtec instruments has various options to characterize wear, scar, scratch, depth, defect, step height precisely. Various options allows to measure features from nm to several mm level.

White light interferometer
  • Scanning white light mode for step height more than 150nm
  • Phase shift mode with green, blue or red light for step height under 150nm
  • Sub nm Z resolution from white light interferometer
  • 100x to 2,5x magnification
  • Scan large or small samples (XY stage 210x200mm)
  • Also creates 3d image
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White light interferometer + AFM combo system
  • For any kind of sample
  • Adds advantages from AFM and white light interferometer on same platform
  • Gets sub nm XYZ resolutions
  • Sample moves automatically between AFM and optical profiler head
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For more info click here