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FILM THICKNESS

Rtec instruments has various options to measure film thickness of transparent and non transparent samples. It can characterize and quantify film thickness from nm to several mm level.

Rtec instruments has various options to characterize radius of curvature from nm to several mm level.

White light interferometer
  • Scanning white light mode for depth more than 150nm
  • Phase shift mode with green, blue or red light for depth under 150nm
  • Sub nm Z resolution from white light interferometer
  • 100x to 2,5x magnificationn
  • Scan large or small samples (XY stage 210x200mm)
  • Also creates 3d image
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For product information click here

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White light interferometer + AFM combo system
  • For any kind of sample
  • Adds advantages from AFM and white light interferometer on same platform
  • Gets sub nm XYZ resolutions
  • Sample moves automatically between AFM and optical profiler head
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For more info click here